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Re: [ATM] Bench star test
I can't seem top find Jarvis' original message, sorry, so I have to go
by the quoted parts:
-------
Jarvis,
>Laser diodes do not make good point sources because the diode
emissions
>are generated in a short very thin line.
This is very true. And yet, region from which emission radiate
is very small. Smaller than traditional point sources as described
for
Foucault
test usage where holes are punched in a foil. It is difficult to make
hole
of the size
of laser diode face. Is the answer in the fact that holes, although
bigger,
are circular?
>If the diode is not lasing,
>then the light source is excellent for use in the Foucault or Ronchi
>test setup.
Why in this case diode should not lase?
>The diode must of course be rotated until the light source
>line is parallel to the knife edge or Ronchi screen.
This is analogy to the slit source usage.
Why this can't be done with lasing diode as well.
-----
Supposing for a simple model, the lasing diode performs as a
rectangular aperture passing coherent light. It will emit a "line" of
light, typically long (but typically truncated by the mechanical
assembly) and perhaps 20 deg wide. This means that the aperture is much
less than one wavelength of light (of some 630-650 nm) and a few
wavelengths wide (say 3-4 micron). When not lasing, i.e. emitting
incoherent light, this ought to be an extremely good point source
(whether the "slit" is wider then, I don't know). When lasing, the
"band" of light is perpendicular to the "slit", and reasonably, the
diode should be oriented so that the band is perpendicular to the knife
edge - the band falls along the measured diameter (but that's perhaps
what was meant??)
Nils Olof
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