Re: [APML] SFL and Flats Was: Fuji Provia 400F and exposure time

[Joe Pedit <pedit@email.unc.edu>]

Lane, Jason R wrote:
 > P.S.
 >
 > Just was thinking that for a film like Kodak Tech Pan with such a
 > very small grain structure, the S/N may be limited by dark current
 > and so you wouldn't get the full benefit of the film.  It depends on
 > if you can detect the grain structure of Tech Pan in a scanned image.
 > If you can, then I'd say all is good.  I don't use Tech Pan so I
 > don't have any to scan in and look at.

An attempt to measure the spatial structure of noise in a scanned tech 
pan image can be found at the bottom of the following link:
<http://www.unc.edu/~pedit/noise3/noise3c.html>
Whether or not the analysis in the above link is really quantifying the 
"grain structure" is an open question.
Joe

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